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, Figure 1: Schematic representation of a polycrystalline sample implanted in a thin surface layer, coloured in red. The X-ray penetration depth is coloured in green. The X-ray incident beam is diffracted by the implanted layer and the strain free substrate
, Figure 2: Mapping of the displacement gradients normal component ? z,z measured by µ-XRD technique, vol.11
, Two UO 2 polycrystals are implanted with helium ions at 60 keV -10 16 ions/cm 2 (a) and 500 keV -10 16 ions/cm 2 (b)