Strain measurement in helium implanted polycristal using image analysis in laue Micro X-ray diffraction patterns - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2013

Strain measurement in helium implanted polycristal using image analysis in laue Micro X-ray diffraction patterns

(1, 2) , (2) , (3) , (2) , (4) , (5) , (6)
1
2
3
4
5
6

Résumé

In order to study the long term behaviour of used nuclear fuel, UO2 polycrystalline samples were implanted by Helium ions. The thin implanted layer, close to the sample surface, is elastically stressed. X-ray micro-diffraction (X- XRD) can be used to measure the induced strain on about 700 different grains of the polycrystal. Image analysis on the Laue diffraction patterns is required for an accurate strain estimation. Three methods to interpret the Laue pattern are developped in this study. The study shows the influence of grain orientation on the results.
Fichier non déposé

Dates et versions

hal-00951483 , version 1 (24-02-2014)

Identifiants

  • HAL Id : hal-00951483 , version 1

Citer

Marcelle Ibrahim, Etienne Castellier, Hervé Palancher, Axel Richard, Philippe Goudeau, et al.. Strain measurement in helium implanted polycristal using image analysis in laue Micro X-ray diffraction patterns. PhotoMechanics 2013, 27 - 29 May 2013, Montpellier University, France, 2013, Montpellier, France. 4 p. ⟨hal-00951483⟩
225 Consultations
0 Téléchargements

Partager

Gmail Facebook Twitter LinkedIn More