Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution

Johann Petit (1) , Michel Bornert (2) , F. Hofmann (3) , O. Robach (4) , J.-S. Micha (5) , O. Ulrich (4) , Christophe Le Bourlot (6) , D. Faurie (6) , A.M. Korsunsky (3) , O. Castelnau (1)

1 PIMM - Laboratoire Procédés et Ingénierie en Mécanique et Matériaux
2 multi-échelle - Modélisation et expérimentation multi-échelle pour les solides hétérogènes
3 University of Oxford
4 ESRF - European Synchrotron Radiation Facility
5 SPRAM - UMR 5819 - Structures et propriétés d'architectures moléculaire
6 LSPM - Laboratoire des Sciences des Procédés et des Matériaux

The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a micrometric spatial resolution. We show that using Digital Image Correlation for measuring Laue pattern distortions between two mechanical states improves significantly the estimate of elastic strain increment. The potentiality of this new Laue-DIC method is illustrated on an elastically bent Si single crystal, for which the measured elastic strain deviates not more than 10-5 from the theoretical strain distribution provided by standard solutions.

Mots clés: X-ray Laue microdiffraction; Digital Images Correlation (DIC); stress field; four point bending; microscopic analysis

Domaines: Mécanique des solides [physics.class-ph]; Mécanique des solides [physics.class-ph]

Johann Petit, Michel Bornert, F. Hofmann, O. Robach, J.-S. Micha, et al.. Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution. IUTAM conference on Full-field Measurements and Identification in Solid Mechanics, 2011, Cachan, France. ⟨10.1016/j.piutam.2012.05.015⟩. ⟨hal-00682505⟩